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Leveraging our proprietary DoD SBIR-developed NIADTM technology*, we support our clients with:  Materials R&DTechnology Acceleration & QualificationsProcess Characterization & AnalysisYield Analysis & EnhancementFailure/Degradation Mechanism Analysis, andIC Fingerprinting & Forensic Analysis*Nanostructural Imaging & Analytical Diagnostic (NIADTM) Technology |
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Our Past and Present Clients Teledyne Imaging Sensors, FLIR Systems, Lockheed Martin (SB Focal Plane), BAE Systems, DRS Technologies, Raytheon Vision Systems, Motorola, ST-Microelectronics, Texas Instruments, Rockwell (Conexant), International Rectifier, Westinghouse, Medtronic (Micro-Rel), Tokyo Electron, Microchip Technology, Honeywell, Lockheed Martin, ASM Epitaxy, Read-Rite, General Motors, Exxon, IC Engineering, EMCORE, Tegal, TRW (Northrop Grumman), Northrop Grumman, Speedfam (Novellus Systems), ATMI Materials, Maxim Integrated Products, US Air Force, Boeing Satellite Systems, Hughes Research Labs, RJ Mears, Phiar, Astralux, Raytheon Space & Airborne Systems, AGI Abbie Gregg, Freescale
Copyright FabMetrix 1992-2023
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